Angstrom Advanced AA5000 Multi-function SPM Systems

Introductions

AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.

Features

Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM; Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; SPM can be in liquid; Real-time temperature and humidity detecting; Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve; Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode; Fast automatically tip-engaging Simply change of the tip holder to switch between STM and AFM; Full digital control, auto system status recognition; Adjustable lightening inside With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved; Controller and Computer connected through a 10M/100M Fast Ethernet; Large sample size: up to diameter 45mm, 30mm thick; Online Control Software and offline Image Processing Software for Windows; Trace-Retrace scan, Back-Forward scan; Online real-time 3D image; Automatically Brightness and Contrast refresh; Data can be loaded out for further analysis; Nano-Movie function: Continuous data collection, storage and replay; Multi-Analysis: Granularity and Roughness; Tip Estimation and Image Re-construction; Modularized design for convenience of maintenance and future upgrade; Second display monitor and optical microscope system attachable;

Specifications

Functions Atomic Force Microscope (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode; Lateral Force Microscope (LFM); Scanning Tunneling Microscope (STM); Conductive AFM, SPM in liquid, Environmental Control SPM; Nano-Processing System including Lithography Mode and Vector Scan Mode; Resolution AFM: 0.26nm lateral, 0.1nm vertical; STM: 0.13nm lateral, 0.01nm vertical; Technical Parameters Current Sensitivity: less than or equal to 10pA; Force Sensitivity:less than or equal to 5pN; Image Pixels: 128X128, 256X256, 512X512, 1024X1024, 2048X2048; Scan Angle: 0-360 degree adjustable; Scan Rate: 0.1-100Hz adjustable; Pre-setting Tunneling Current: 0.001-10nA Bias: -10-+10V; Temperature Sensitivity: 0.1Celsius, Humidity Sensitivity: 0.5%RH; Sample Size: Up to 50mmx50mm, 30mm thick; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm; Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x; Electronics CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; DAC: 20 channels of 16-bit DAC; ADC: 20 channels of 16-bit ADC; Communication Interface: 10M/100M Fast Ethernet; For more information https://angstromadvancedhydrogen.wordpress.com/ http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html http://angstromadvanced1.blogspot.com/ https://angstromadvancedinc.wordpress.com/ http://angstrom-advanced1.blogspot.com/ http://angstrom-advanced.blogspot.com/ http://angstromadvancedinc1.blogspot.com

Angstrom Advanced AA2000 Atomic Force Microscope

AA2000 Atomic Force Microscope
Features

High Performance

• Atomic-scale of resolution
• Large sample size
• DSP(Digital Signal Processing) for great performance
• Real time operating system embedded
• Fast Ethernet connection with computer

Multi-Function

• Atomic Force Microscope (AFM)
• Lateral Force Microscope (LFM)
• Force Analysis: I-V Curve, I-Z Curve, Force Curve
• Online real-time 3D image for better observation
• Multi-channel signals for more sample details
• Trace-Retrace scan, Back-Forward scan
• Multi-Analysis: Granularity and Roughness
• Data load-out for further analysis

Easy Operation

• Fast automatically tip-engaging
• Easy change of the tip holder, for simple switching between STM and AFM
• Full digital control, auto system status recognition
• Software-based sample movement
• Nano-Movie function: Continuous data collection, storage and replay
• Modularized design for convenient maintenance and future upgrades

Specifications

Functions	Atomic Force Microscope (AFM) Lateral Force Microscope (LFM)
Resolution	AFM: 0.26nm lateral, 0.1nm vertical
Technical Parameters	X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz
Electronics	CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet
Mechanics	Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
Software	Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x

For more information

https://angstromadvancedhydrogen.wordpress.com/

http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html

https://www.pinterest.com/pin/309481805615112886/

Angstrom Advanced AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

AXFG series portable X-ray flaw detector (with rippled ceramic x-ray tube)

Introduction

AXFG series detector is equipped with a rippled ceramic x-ray tube. Some of the advantages of using rippled ceramic x-ray tube are: higher voltage and power, smaller size, higher stability and longer service life. With its long service life, good shockproof ability, compact size and lightweight design, AXFG X-ray flaw detector is the best choice for most applications.

Models and Specifications

Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) AXFG-1605 60~160 1.5 0.8 × 0.8 40±5° 19 14.5 225 × 225 × 550 AXFG-2005 100~200 2.0 2.0 × 2.0 40 ± 5° 30 18 285 × 285 × 615 AXFG-2505 150~250 2.5 2.0 × 2.0 40 ± 5° 40 30.5 320 × 320 × 640 AXFG-3005 170~300 3.0 2.5 × 2.5 40 ± 5° 50 36.5 345 × 345 × 670

Angstrom Advanced AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube) Introduction

AXFH series portable panoramic X-ray flaw detector (with glass x-ray tube)

Introduction

AXFH series portable circumferential glass tube X-ray flaw detector is designed to facilitate non destructive testing (NDT) of welding seam of pipes and tubes with small diameters. With the optional propelling wheels or pipe crawler installed, the X-ray generator can be easily positioned in any pipe. The NDT of circumferential welding can be accomplished in one exposure.

Types and Specifications

Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) cone target planar target cone target planar target AXFH-1005 50~100 1.2 0.8 × 0.8 30±5° 25±5° 4 6 11.1 190 × 190 × 520 AXFH-1605 60~160 1.5 0.8 × 0.8 30±5° 25±5° 12 15 15.2 225 × 225 × 585 AXFH-2005 100~200 2.0 1.5 × 1.5 30±5° 25±5° 24 27 23 285 × 285 × 665 AXFH-2505 150~250 2.5 2.0 × 2.3 30±5° 25±5° 34 37 35 320 × 320 × 730 AXFH-3005 170~300 3.0 2.3 × 2.3 30±5° 25±5° 44 47 45.5 345 × 345 × 830 AXFH-3205 180~320 3.2 2.5 × 2.3 30±5° 25±5° 45 50 45.5 345 × 345 × 830 AXFH-3505 180~350 3.4 2.8 × 3.0 30±5° 25±5° 52 55 47 345 × 345 × 800

Angstrom Advanced AXFQ series portable directional X-ray flaw detector (with glass x-ray tube

	AXFQ series portable directional X-ray flaw detector (with glass x-ray tube) Introduction The AXFQ series flaw detectors are ideal for non destructive testing (NDT) of thin iron plate, aluminum material, rubber and so on.The glass x-ray tube allows to get images of excellent quality and clarity. Types and Specifications   Type Output Voltage (kv) Input Power (kw) Focal Spot Size (mm2) Divergent Angle Max. Penetrate Depth in Steel (mm) Generator Weight (kg) Generator Size (mm3) AXFQ-1005 50~100 1.2 0.8 × 0.8 40° 8 11.1 190 × 190 × 520 AXFQ-1605 60~160 1.5 0.8 × 0.8 40° 19 15.2 225 × 225 × 585 AXFQ-2005 100~200 2.0 1.5 × 1.5 40 ± 5° 30 23 285 × 285 × 665 AXFQ-2505 150~250 2.5 2.0 × 2.3 40 ± 5° 40 35 320 × 320 × 730 AXFQ-3005 170~300 3.0 2.3 × 2.3 40 ± 5° 50 45.5 345 × 345 × 830 AXFQ-3205 180~320 3.2 2.5 × 2.3 40 ± 5° 55 45.5 345 × 345 × 830 AXFQ-3505 180~350 3.4 2.8 × 3.0 40 ± 5° 60 47 345 × 345 × 800

Angstrom Advanced ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument

ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument Introduction ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 can be used for many different applications – Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.. Features Perfect incorporation of the hardware and software, allows ADX-8000 to perform different types of analysis for researchers from various fields; High precision of the diffraction angle measurement allows ADX-8000 to obtain the more accurate data; Higher stability of the X-ray generator control system provides excellent measurement accuracy; Simple and effective design makes ADX-8000 convenient for operation and user friendly. Software General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al. Qualitative Analysis The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match Plot and Export The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted. Parts and Specifications X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 600W, 1200W Tube voltage 40 kV continuously adjustable Tube current 13-30mA continuously adjustable X-ray tube Cu (2.4KW) Focus dimension: 1×10 mm2 LFF Ceramic or Glass Stability ≤ 0.001% Goniometer Goniometer θ – θ Diffraction circle semi-diameter 150mm Scan range of 2θ -3°-150° Continuous scanning rate 0.0012°-70°/min Setting speed of angle 1500°/min Scan mode θ-θ linkage, 2θ,2θ continuous or step scanning One way repeatability of θ ≤ 0.0001° Minimal stepping angle 0.0001° Precision of θd or θs ≤ 0.0001° Filter Ni Slits ≤ Divergence slit, Scattering slit, receiving slit; Record Unit Counter Proportional Counter Maximal CPS 5×105 CPS , 5×107 CPS Proportion counter energy spectrum resolution ≤ 25%(Cu, Ka) Detectable high voltage 1500-2100 continuous tune High voltage of the counter differential or integral, automatic PHA, dead time emendation System detector stability ≤ 0.03% Sample Stage Z Adjustable Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.1% Micro Structure Micro Structure analysis, +/-0.5nm Micro Diffraction Micro sample or area, 2nm-19 um Dimensions 24 X 16 X 26 Inches

For more information

https://angstromadvancedhydrogen.wordpress.com/

http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html

http://angstromadvanced1.blogspot.com/

https://angstromadvancedinc.wordpress.com/

http://angstrom-advanced1.blogspot.com/

http://angstrom-advanced.blogspot.com/

http://angstromadvancedinc1.blogspot.com

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Angstrom Advanced ADX-2700 X-ray Powder Diffraction Instrument

Introduction

ADX-2700 θ-θ Powder X-ray Diffraction Instrument is multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX2700 is a diffraction instrument designed for the challenges of modern materials research. ADX2700 can analyze powders, liquids, thin films, nanomaterials and many other different materials. The ADX2700 can be used for many different applications: Academic, Pharmaceuticals, Chemical & Petrochemical, Material Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.

Features

Computed tomography, High-resolution X-ray diffraction, High throughput screening, In-plane diffraction, Crystallite size and micro-strain analysis, Micro-diffraction, Non-ambient diffraction, Pair distribution function analysis, Phase identification, Phase quantification, Reflectivity analysis, Residual stress analysis,

Crystallography, Texture analysis, Transmission, Thin film analysis.

ADX-DWZ Combination of Eulerian cradle for stress and texture investigations, Thin film and Quantity Analysis attachment with control and analysis software with alignment-free feature. ADCX sample changer is compact and rugged. Integrated spinning improves particle statistics in polycrystalline sample measurements. 

For more information

https://angstromadvancedhydrogen.wordpress.com/

http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html

http://angstromadvanced1.blogspot.com/

https://angstromadvancedinc.wordpress.com/

http://angstrom-advanced1.blogspot.com/

http://angstrom-advanced.blogspot.com/

http://angstromadvancedinc1.blogspot.com

ANGSTROM ADVANCED ADX-2500 X-RAY DIFFRACTION INSTRUMENT

ADX-2500 X-ray Diffraction Instrument
Introduction
ADX-2500 X-ray Diffraction Instrument is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software,ADX-2500 is a diffraction system according to the practical requirements in many fields. ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
Features
Perfect incorporation of the hardware and software, allows ADX-2500 to perform different types of analysis for researchers from various fields; High precision of the diffraction angle measurement allows ADX-2500 to obtain the more accurate data; Higher stability of the X-ray generator control system provides excellent measurement accuracy; Simple and effective design makes ADX-2500 convenient for operation and user friendly.
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern. Profile fitting and overlapped peeks separation With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain. Qualitative Analysis The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Plot and Export The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Parts and Specifications
X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 4 kW Tube voltage 10-60 kV Tube current 5-80 mA X-ray tube Cu, Fe, Co, Cr, Mo et al (2.4 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2 Stability ≤ 0.01% Goniometer Goniometer thetaθ/thetaθ Diffraction circle semi-diameter 225mm Scan range of 2θ -6°-160° Continuous scanning rate 0.06°-50°/min Setting speed of angle 1500°/min Scan mode θ-2θ linkage, θ,2θ one way: continuous or step scanning One way repeatability of 2θ ≤ 0.001° Minimal stepping angle 0.001° Precision of 2θ ≤ 0.02° Record Unit Counter PC or SC Maximal CPS 5×106 CPS Proportion counter energy spectrum resolution ≤ 25%(PC), ≤ 55%(SC) Detectable high voltage 1500-2100 V continuous tune High voltage of the counter differential or integral, automatic PHA, dead time emendation System detector stability ≤ 0.01% Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.5% Dimension 1000 × 800 × 1600 mm

For more information

http://angstrom-advanced1.blogspot.com/

http://angstrom-advanced.blogspot.com/

http://angstromadvancedinc1.blogspot.com

ANGSTROM ADVANCED NUCLEAR MAGNETIC RESONANCE NMR-900

Nuclear Magnetic Resonance NMR-900

Introduction

Compact easy-to-use Nuclear Magnetic Resonance NMR-900 system for routine high resolution Proton/Carbon NMR in the field of academic teaching as well as for routine chemical and pharmaceutical applications….

Applications

Typical applications of the NMR-900 Spectrometer are: Structural Elucidation of organic molecules Chemical Shift Small division from J-J coupling Teaching of the fundamentals of NMR and of advanced NMR techniques The NMR-900 Spectrometer comprises of an extremely compact control cabinet with RF and digital electronics, magnet system, Pneumatic system and PC workstation .

Specifications

The Control Cabinet Features: 60-90 MHz digital frequency generation channels based on state-of- the-art FPGA technology with digital pulse sequence generation and digital signal routing High sensitivity receiver with digital oversampling and digital filtering technology Technology of Pulse Fourier Transfer NMR High sensitive: 10000:1 Constant temperature stability: 0.1K/h (4 hours after launch the device) Degree of uniformity: 2Hz(0.03ppm) Easy one-button power-on mode Green Technology (low power consumption < 400 W; low acoustic noise, < 40 dB(A) MAGNET SYSTEM The Pole diameter of magnet is 12 cm. Helium Resonance frequency is 60-90 MHz Helium transfer line (measurement of J-J coupling and Chemistry Shift) Size (m): 0.7×0.7×1 PC Workstation 2.4 GHz Intel Core2 Duo Processor, 4 GB DDR Memory, 500 GB Hard Disk, DVD +/- RW, LCD display monitor, keyboard and mouse. Control and Data Analysis Software Includes RIGHTS-TO-USE LICENCES FOR: Data acquisition Data processing , data analysis, simulation and educational tools

For more information

https://angstromadvancedhydrogen.wordpress.com/

http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html

http://angstromadvanced1.blogspot.com/

https://angstromadvancedinc.wordpress.com/