AA2000 Atomic Force Microscope
Features
High Performance
- Atomic-scale of resolution
- Large sample size
- DSP(Digital Signal Processing) for great performance
- Real time operating system embedded
- Fast Ethernet connection with computer
Multi-Function
- Atomic Force Microscope (AFM)
- Lateral Force Microscope (LFM)
- Force Analysis: I-V Curve, I-Z Curve, Force Curve
- Online real-time 3D image for better observation
- Multi-channel signals for more sample details
- Trace-Retrace scan, Back-Forward scan
- Multi-Analysis: Granularity and Roughness
- Data load-out for further analysis
Easy Operation
- Fast automatically tip-engaging
- Easy change of the tip holder, for simple switching between STM and AFM
- Full digital control, auto system status recognition
- Software-based sample movement
- Nano-Movie function: Continuous data collection, storage and replay
- Modularized design for convenient maintenance and future upgrades
| Functions | Atomic Force Microscope (AFM) Lateral Force Microscope (LFM) |
| Resolution | AFM: 0.26nm lateral, 0.1nm vertical |
| Technical Parameters | X-Y scan scope:~10 micrometer Z distance:~2 micrometer Image Pixels:128X128, 256X256, 512X512, 1024X1024 Scan Angle:0~360 degree Scan Rate: 0.1~100Hz |
| Electronics | CPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments; Fast16-bit DAC Fast16-bit ADC High Voltage: 5 channel Communication Interface: 10M/100M Fast Ethernet |
| Mechanics | Sample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000; Engagement: Auto engagement with travel distance of 30mm and precision of 50nm |
| Software | Online Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x |
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