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| ADX-8000 Mini θ – θ Powder X-ray Diffraction Instrument |
| Introduction |
| ADX-8000 mini θ-θ Powder X-ray Diffraction Instrument is a multi-function diffractometer with exceptional analysis speed, reliability and reproducibility. The ADX8000 has been uniquely designed for the challenges of modern materials research, where the lifetime of a diffractometer is considerably longer than the horizon of any research project. Components are top of the line and provide for a powerful system. The ADX8000 has capability for powders, liquid, thin film, nanomaterials and many other different materials. The ADX8000 can be used for many different applications – Academic, Pharmaceuticals, Chemical & Petrochemical, Materials Research, Thin Film Metrology, Nano technology, Food & Cosmetics, Forensics, Mining & Minerals, Metals, Plastics & Polymers, etc.. |
| Features |
- Perfect incorporation of the hardware and software, allows ADX-8000 to perform different types of analysis for researchers from various fields;
- High precision of the diffraction angle measurement allows ADX-8000 to obtain the more accurate data;
- Higher stability of the X-ray generator control system provides excellent measurement accuracy;
- Simple and effective design makes ADX-8000 convenient for operation and user friendly.
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| Software |
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1,α2, background remove, lattice parameter, volumes and atomic position, phase analysis, crystallographic strain, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern et al.
- Qualitative Analysis
The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error.
- Quantitative Analysis
After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Phase identification, structure & microstructure analysis, thin film analysis, stress investigation, texture analysis are all available. PDF-2, PDF-4 Series Data base, ICDD, Search & Match, Crystallographic Search & Match
- Plot and Export
The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
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| Parts and Specifications |
| X-ray Generator | Control mode | 1kV/step, 1mA/step controlled by PC |
| Rated output power | 600W, 1200W |
| Tube voltage | 40 kV continuously adjustable |
| Tube current | 13-30mA continuously adjustable |
| X-ray tube | Cu (2.4KW) Focus dimension: 1×10 mm2 LFF Ceramic or Glass |
| Stability | ≤ 0.001% |
| Goniometer | Goniometer | θ – θ |
| Diffraction circle semi-diameter | 150mm |
| Scan range of 2θ | -3°-150° |
| Continuous scanning rate | 0.0012°-70°/min |
| Setting speed of angle | 1500°/min |
| Scan mode | θ-θ linkage, 2θ,2θ continuous or step scanning |
| One way repeatability of θ | ≤ 0.0001° |
| Minimal stepping angle | 0.0001° |
| Precision of θd or θs | ≤ 0.0001° |
| Filter | Ni |
| Slits | ≤ Divergence slit, Scattering slit, receiving slit; |
| Record Unit | Counter | Proportional Counter |
| Maximal CPS | 5×105 CPS , 5×107 CPS |
| Proportion counter energy spectrum resolution | ≤ 25%(Cu, Ka) |
| Detectable high voltage | 1500-2100 continuous tune |
| High voltage of the counter | differential or integral, automatic PHA, dead time emendation |
| System detector stability | ≤ 0.03% |
| Sample Stage | Z Adjustable |
| Integrated performance | Dispersion dosage | ≤ 1μSv/h |
| Integrated stability of the system | ≤ 0.1% |
| Micro Structure | Micro Structure analysis, +/-0.5nm |
| Micro Diffraction | Micro sample or area, 2nm-19 um |
| Dimensions | 24 X 16 X 26 Inches |
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