Angstrom Advanced Knowledge base: Atomic Force Microscope/Scanning Probe Microscope

The sample is placed on the Piezo Electric Scanner and is scanned under a stationary cantilever tip (there are AFM models in which the tip is scanned over a stationary sample). The PES is a very precise component and is able to accurately move the sample through a scan (a back and forth raster pattern) of only a few hundred nanometers. Scanners are made of piezo tubes and are steady held in the SPM base.Voltage applied to piezoelectric scanner tube housed inside moves sample precise increments back and forth. Size at bottom indicates maximum size scan possible,each scanner has its own specified parameters. 

Samples are held in place on the scanner with a removable cap. Piezo scanner can extend and retract 3-dimentionally based on the applied X, Y and Z voltage placed across the individual elements.

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