November 2, 2016

Angstrom Advanced AA2000 Atomic Force Microscope



AA2000 Atomic Force Microscope
Features
High Performance
  • Atomic-scale of resolution
  • Large sample size
  • DSP(Digital Signal Processing) for great performance
  • Real time operating system embedded
  • Fast Ethernet connection with computer
Multi-Function
  • Atomic Force Microscope (AFM)
  • Lateral Force Microscope (LFM)
  • Force Analysis: I-V Curve, I-Z Curve, Force Curve
  • Online real-time 3D image for better observation
  • Multi-channel signals for more sample details
  • Trace-Retrace scan, Back-Forward scan
  • Multi-Analysis: Granularity and Roughness
  • Data load-out for further analysis
Easy Operation
  • Fast automatically tip-engaging
  • Easy change of the tip holder, for simple switching between STM and AFM
  • Full digital control, auto system status recognition
  • Software-based sample movement
  • Nano-Movie function: Continuous data collection, storage and replay
  • Modularized design for convenient maintenance and future upgrades
Specifications
FunctionsAtomic Force Microscope (AFM)
Lateral Force Microscope (LFM)
ResolutionAFM: 0.26nm lateral, 0.1nm vertical
Technical ParametersX-Y scan scope:~10 micrometer
Z distance:~2 micrometer
Image Pixels:128X128, 256X256, 512X512, 1024X1024
Scan Angle:0~360 degree
Scan Rate: 0.1~100Hz
ElectronicsCPU: 32-bit Digital Signal Processor (DSP) at 600MHz from Texas Instruments;
Fast16-bit DAC
Fast16-bit ADC
High Voltage: 5 channel
Communication Interface: 10M/100M Fast Ethernet
MechanicsSample Size: Up to 45mm in diameter, reach 15mm when use a AA2000/AA3000,and reach 30mm when use the AA5000;
Engagement: Auto engagement with travel distance of 30mm and precision of 50nm
SoftwareOnline Control Software and offline Image Processing Software for Windows Vista/XP/2000/9x

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