The Software is available with the following data types of images:
AFM Contact Mode:
- Topography — the rise and fall of the sample surface.
- Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can
- be reflected by the photodetector’s Up-Down signal.
- Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the photodetector’s Left-Right signal.
AFM Tapping Mode:
- Topography — the rise and fall of the sample surface.
- Amplitude — cantilever oscillating amplitude changes because of the rise and fall of sample topography.
- Phase — cantilever oscillating phase changes because of the sample material characteristics.
Scanning Tunneling Microscope:
- Topography —the rise and fall of the sample surface.
- Current — Tunneling current changes between tip and sample surface.
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