December 22, 2016

Angstrom Advanced AA8000 Multi-function SEM System

Introductions
Angstrom AA8000-SEM is a true multi-purpose, multi-user instrument. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user material research environment. This instrument features a perfect balance between stable configuration and an excellent resolution. Angstrom-SEM clearly shows Angstrom’s state-of-art technology. Its rock-solid reliability and fully automated control functions provide customer with the maximum analytical capability. Angstrom-SEM pursues compact SEM design which is great for office environment. Angstrom-SEM provides high scan speed and pixel resolution and high performance control driver with new PCI board. A full set of automated image adjustment functions make it easy for new users to quickly acquire crisp, noise-free images. Even experienced users will benefit from the automated contrast, brightness and focus.

Features
High Performance
• Field proven image quality
• Upgraded scan speed and pixel resolution.
• Wide variety of optional instrument
• Resolution : 3.0 nm
• Magnification : ~1,000,000X
• Display : Photo 4096X 4096
• Search : 640X480 30fps
• Options : BSE / WDS / EDS / EBSD / Etc.
Gun Coumn
• Gun design for stable current supply
• Dual field objective lens for spherical
• Aberration reduction
• Movable aperture for beam centering
• Upgraded design of magnetic lens (CL/OL)
Chamber & Stage
• 5 axis eucentric stage
• Option: Stage motorization
• EDS,WDS,CCD, Manipulator etc
• 50X60X57mm
Detector
• ET-bar type SE detector
• SE & BSE double image mode
• Option: BSE detector
GUI
• Window based GUI
• PC controlled operation
• Image thumbnail & storage
• Parameter Display
Vacuum System
• Automatic & Manual control
• Automatic Safety System
• R.P+D.P/ R.P+TMP
Image Analyzer
• Data transfer to Excel
• Particle counter for blob analysis
• Multi-focusing & Tiling
• 3D data view etc


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December 21, 2016

Angstrom Advanced AA7000 SEM Scanning Electron Microscope

Introductions
Angstrom-SEM is a true multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment. On this instrument, there is a perfect balance between stable configuration and an excellent resolution.
 
Specifications

 
 
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December 19, 2016

AA6000 Mini Desktop Scanning Electron Microscope

Introduction
Angstrom-mini-SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment, and perfect balance between stable configuration and excellent resolution.

Specifications- Resolution: 7nm(Option: 5nm@20KV)- Acceleration Voltage: 0.6KeV ~ 20KeV (Option: 30KV)- Visual Inpection Source: Electron induced Display (Tungsten Hair Pin Type)- Probe Current: nA ~pA for SEM, Max. ~ 3uA- Bean Control: Beam Shift : ±125um, Beam Rotation: 360°- SE Detector: High Sensitivity SE detector- Image Signal process: 5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880)- Work-Piece Positioning: Tilted Holder 0°~60° (Max 90°)- 5 Axis Stage Movement Stroke: X/Y/Z/=-40/40/30mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R)- Vacuum system: Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge)- Anti-Vibration: Air-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site- Control Rack: PC Environmental Operation Operating system : Windows Serial communication: control data interface- Display System: 22” LCD monitor- Port: 3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation- GUI& Tools: BSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display- Image Processor: Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis)- Automatic Control: Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology)



 

 

 

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December 16, 2016

Angstrom Advanced AA5000 Multi-function SPM Systems


Introductions
AA5000 Scanning Probe Microscope is Angstrom most innovated model. AA5000 features a full coverage of SPM techniques-STM, AFM, LFM Conductive AFM, MFM, EFM, Environmental Control SPM and Nano-Processing... AA5000 is designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor (DSP) TMS320C642 inside the system, AA5000 can handle complicated multi-functional tasks efficiently. A real-time operating system of SPM/DNA is embedded in AA5000 SPM system.

 
Features
• Multi-function: AFM, LFM, STM, Conductive AFM, MFM and EFM;
• Multi-Mode: Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode;
• SPM can be in liquid;
• Real-time temperature and humidity detecting;
• Force Analysis: I-V Curve, I-Z Curve, Force Curve and Amplitude Curve;
• Nano-Processing and manipulating: Lithography Mode and Vector Scan Mode;
• Fast automatically tip-engaging
• Simply change of the tip holder to switch between STM and AFM;
• Full digital control, auto system status recognition;
• Adjustable lightening inside
• With a 32-bit Digital Signal Processor (DSP) from Texas Instruments, 4.8 billion times of calculation per second can be achieved;
• Controller and Computer connected through a 10M/100M Fast Ethernet;
• Large sample size: up to diameter 45mm, 30mm thick;
• Online Control Software and offline Image Processing Software for Windows;
• Trace-Retrace scan, Back-Forward scan;
• Online real-time 3D image;
• Automatically Brightness and Contrast refresh;
• Data can be loaded out for further analysis;
• Nano-Movie function: Continuous data collection, storage and replay;
• Multi-Analysis: Granularity and Roughness;
• Tip Estimation and Image Re-construction;
• Modularized design for convenience of maintenance and future upgrade;
• Second display monitor and optical microscope system attachable;

Specifications
 

 

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December 15, 2016

Angstrom Advanced PHE-104 Infrared Spectroscopic Ellipsometer


 
Angstrom Advanced PHE-104 Infrared Spectroscopic Ellipsometer

Parameters：
Wavelength: 4000-400cm-1(2.5-25um)
Beam size: 1X34mm
Automated incident angle：35° to 90°，0.01°/Step
Functions/Features：
Film’s thickness, N & K measurement;
Resistivity measurements and doping profiles;
Identification of chemical bonds and buried layers investigation ;
Transmittance and reflectance;
 
 
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December 2, 2016

Angstrom Advanced combined Thermogravimetric Analysis (TGA) , Differential Thermal Analysis(DTA) and Differential Scanning Calorimetry(DSC) Systems


TGA/DSC/DTA Apparatus
Temperature range: according to selected furnace
-150 … 2000°C, for cp determination up to 1500°C
 
Consisting of:
A) Basic Unit
Basic system with sample carrier support with reproducible adjustment, purge gas inlet to the sample, inbuilt µV-preamplifier electronics and electric motor driven furnace hoist (basic system). The system is suitable for measurements under normal atmosphere, in dynamic and static inert gas atmosphere, it is evacuable (down to 10E-2 mbar).
           
Accessory kit for furnace hoist for one furnace, with manual pivoting mechanism
           
Silicon Carbide furnace, working temperature range 25 ... 1550°C high temperature tube furnace with SiC heating element, integrated, exchangeable protective tube for gas flow with stop valve, air-cooled double shell, integrated control thermocouple type S, voltage supply 75 V max.
 (for measurements in the low temperature range helium has to be used as sample atmosphere)
 
B) Sample Carrier
Sample carrier system, also for cp determinations, complete with radiation shield and thermocouples type S
2 sample crucibles 399.205 (PtRh) with lids 399.860 for temperature range 25 ... 1500°C, for cp-determinations ... 1400°C
2 sample pans 399.972 (Al2O3) with lids 399.973 for temperature range 25 ... 1650°C
 
C) Software Package
Software with data acquisition, storage and evaluation under MS WINDOWS, 32 bit.
Features:
multitasking with simultaneous operation of several TA systems and simultaneous evaluation
graphical user surface, integrated detailed HELP system
                                                                                                           
D) Calibration
DSC/DTA calibration kit (temperature and enthalpy)
temperature range -50 ... 750°C, consisting of 8 samples (400 mg each) with manufacturer certificate and detailed calibration instructions, for use in Al2O3 crucible
 
E) Vacuum pump for measurements under pure atmosphere
Evacuating system for manual operation, with double-head diaphragm vacuum pump (final pressure 10E-5 mbar), with valves and connection lead (115/230 V, 50/60 Hz)

 
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