ANGSTROM ADVANCED ADX-2500 X-RAY DIFFRACTION INSTRUMENT

ADX-2500 X-ray Diffraction Instrument
Introduction
ADX-2500 X-ray Diffraction Instrument is designed for application in the microstructure measurement, testing and in-depth research investigations. With different accessories and the corresponding control and calculating software,ADX-2500 is a diffraction system according to the practical requirements in many fields. ADX-2500 X-ray Diffraction Instrument provides the structure analysis of single crystal, polycrystalline and amorphous sample.ADX-2500 is capable of the following: phase qualitative analysis and quantitative analysis (RIR, Internal standard calibration, External standard calibration, Additive criterion), pattern indexing, unit cell determination and refinement, crystallite size and strain determination, profile fitting and structure refinement, residual stress determination, texture analysis(ODF expresses three-dimensional pole figure), crystallinity estimate from peak areas, thin film analysis and others.
Features
Perfect incorporation of the hardware and software, allows ADX-2500 to perform different types of analysis for researchers from various fields; High precision of the diffraction angle measurement allows ADX-2500 to obtain the more accurate data; Higher stability of the X-ray generator control system provides excellent measurement accuracy; Simple and effective design makes ADX-2500 convenient for operation and user friendly.
Software
General diffraction data processing: automatic peak search, manual peak search, integral intensity, separation of Kα1, α2, background remove, pattern smoothing and magnifying, multiple plot, three-dimensional plot and simulation of XRD pattern. Profile fitting and overlapped peeks separation With the help of Pseudo-Voigt or Pearson-VII function, the overlapped peeks could be separated to determine the parameters of the peaks and calculate the crystallinity, crystallite size and strain. Qualitative Analysis The data processing software has the search and match function on the base of whole profile and diffraction angle. The profile matching procedure employs the designed mode to do the qualitative analysis by reducing the search range from major, minor, to micro phase without indicating the diffraction angle. The diffraction angle matching procedure is based on the peaks position and intensity and usually used for the qualitative analysis of the data with large angle error. Quantitative Analysis After the phase composition is determined, the content of each phase could be calculated with the help of RIR or/and the Rietveld refinement (Quantitative Analysis without criterion). Plot and Export The data processing software is operated with Windows interface. The preparing exported pattern could be labeled, zoomed in, zoomed out and also copied and pasted.
Parts and Specifications
X-ray Generator Control mode 1kV/step, 1mA/step controlled by PC Rated output power 4 kW Tube voltage 10-60 kV Tube current 5-80 mA X-ray tube Cu, Fe, Co, Cr, Mo et al (2.4 kW) Focus dimension: 1×10 mm2 or 0.4×10 mm2 Stability ≤ 0.01% Goniometer Goniometer thetaθ/thetaθ Diffraction circle semi-diameter 225mm Scan range of 2θ -6°-160° Continuous scanning rate 0.06°-50°/min Setting speed of angle 1500°/min Scan mode θ-2θ linkage, θ,2θ one way: continuous or step scanning One way repeatability of 2θ ≤ 0.001° Minimal stepping angle 0.001° Precision of 2θ ≤ 0.02° Record Unit Counter PC or SC Maximal CPS 5×106 CPS Proportion counter energy spectrum resolution ≤ 25%(PC), ≤ 55%(SC) Detectable high voltage 1500-2100 V continuous tune High voltage of the counter differential or integral, automatic PHA, dead time emendation System detector stability ≤ 0.01% Integrated performance Dispersion dosage ≤ 1μSv/h Integrated stability of the system ≤ 0.5% Dimension 1000 × 800 × 1600 mm

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ANGSTROM ADVANCED NUCLEAR MAGNETIC RESONANCE NMR-900

Nuclear Magnetic Resonance NMR-900

Introduction

Compact easy-to-use Nuclear Magnetic Resonance NMR-900 system for routine high resolution Proton/Carbon NMR in the field of academic teaching as well as for routine chemical and pharmaceutical applications….

Applications

Typical applications of the NMR-900 Spectrometer are: Structural Elucidation of organic molecules Chemical Shift Small division from J-J coupling Teaching of the fundamentals of NMR and of advanced NMR techniques The NMR-900 Spectrometer comprises of an extremely compact control cabinet with RF and digital electronics, magnet system, Pneumatic system and PC workstation .

Specifications

The Control Cabinet Features: 60-90 MHz digital frequency generation channels based on state-of- the-art FPGA technology with digital pulse sequence generation and digital signal routing High sensitivity receiver with digital oversampling and digital filtering technology Technology of Pulse Fourier Transfer NMR High sensitive: 10000:1 Constant temperature stability: 0.1K/h (4 hours after launch the device) Degree of uniformity: 2Hz(0.03ppm) Easy one-button power-on mode Green Technology (low power consumption < 400 W; low acoustic noise, < 40 dB(A) MAGNET SYSTEM The Pole diameter of magnet is 12 cm. Helium Resonance frequency is 60-90 MHz Helium transfer line (measurement of J-J coupling and Chemistry Shift) Size (m): 0.7×0.7×1 PC Workstation 2.4 GHz Intel Core2 Duo Processor, 4 GB DDR Memory, 500 GB Hard Disk, DVD +/- RW, LCD display monitor, keyboard and mouse. Control and Data Analysis Software Includes RIGHTS-TO-USE LICENCES FOR: Data acquisition Data processing , data analysis, simulation and educational tools

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Angstrom Advanced Magnetic Resonance Imaging MRI-300

Magnetic Resonance Imaging MRI-300

Introduction

Magnetic Resonance Imaging MRI-300 is specially designed for living animal’s observation. it provides high contrast images and accurate messages in vivo intuitively, equipped with permanent magnet. As a powerful and non-destructive MRI instrument, this system is widely used in life sciences to study tissue structure in vivo and their contrast message dispense with special maintenance cost.... Applications Contrast agent MRI of subcutaneous tumor Multilayer MRI of 150g rat's head MRI Specifications Magnet: permanent,0.5±0.05T: Magnetic field uniformity: ≤ 20ppm(60mm×60mm×60mm); Magnetic field stability: ≤300Hz/Hour; Magnet temperature control: dual system of nonlinear precise temperature control, temperature tunable from 25℃ to 35℃ ; temperature control accuracy ±0.05℃ ; RF field: pulse frequency: 2~30MHz; frequency control accuracy: 0.1Hz; RF power amplifier: peak-to-peak value > 300W; Maximum bandwidth is 2000KHz; MRI gradient: X, Y, Z-peak intensity > 2.5Gauss/cm; Probe caliber: 60mm; Effective detection area: Ø60mm×H60mm; Image quality: image linearity (x, y, z three direction) > 90%, spatial resolution better than 1mm; Maximum echo peak number is 18,000; minimum echo time is 360us; Based on PCI bus industrial control computer platform, dual-core CPU, 4G DDR memory, 500G hard disk, DVD_R/W CD-ROM. Power supply: 220V, 50Hz Work temperature: 22~28°C Environment humidity: 30~70% Dimensions (L, W, H): 1540mm×800mm×1200mm. Total Weight:0.8 tons(Magnet 0.7 tons, control cabinet 0.1 tons) For more information https://angstromadvancedhydrogen.wordpress.com/ http://angstrom-advanced-xrd.weebly.com/angstrom-advanced-xrd.html https://www.pinterest.com/pin/309481805615112886/ http://angstromadvanced1.blogspot.com/ https://angstromadvancedinc.wordpress.com/

AA7000 SEM Scanning Electron Microscope

AA7000 SEM Scanning Electron Microscope Introductions Angstrom-SEM is a true multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment. On this instrument, there is a perfect balance between stable configuration and an excellent resolution. Specifications Resolution 7nm(Option: 5nm@30KV) Magnification 10X ~100,000X Acceleration Voltage 0.6KeV ~ 20KeV (Option: 30KV) Visual Inpection Source Electron induced Display (Tungsten Hair Pin Type) Probe Current nA ~pA for SEM, Max. ~ 3uA Bean Control Beam Shift : ±125um, Beam Rotation: 360° SE Detector High Sensitivity SE detector Image Signal process 5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880) Work-Piece Positioning Tilted Holder 0°~60° (Max 90°) 5 Axis Stage Movement Stroke X/Y/Z/=-40/40/40mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R) Vacuum system Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge) Anti-Vibration Air-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site Control Rack PC Environmental Operation Operating system : Windows Serial communication: control data interface Display System 22” LCD monitor Port 3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation GUI& Tools BSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display Image Processor Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis) Automatic Control Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology) Chamber Volume F210 X190 (H) mm EDS port: 25°

AA6000 MINI DESKTOP SCANNING ELECTRON MICROSCOPE

Introductions

Angstrom-mini-SEM is a true desktop multi-purpose, multi-user Scanning Electron Microscope. It excels in versatility and flexibility by combining high performance in all SEM modes & Particle counter with ease of operation in a multi-user materials research environment, and perfect balance between stable configuration and excellent resolution.

Specifications

Resolution 7nm(Option: 5nm@20KV) Acceleration Voltage 0.6KeV ~ 20KeV (Option: 30KV) Visual Inpection Source Electron induced Display (Tungsten Hair Pin Type) Probe Current nA ~pA for SEM, Max. ~ 3uA Bean Control Beam Shift : ±125um, Beam Rotation: 360° SE Detector High Sensitivity SE detector Image Signal process 5 Steps: Area(768X576),Search (960X720, 1280*960) Photo Mode (1920X1440, 3840X2880) Work-Piece Positioning Tilted Holder 0°~60° (Max 90°) 5 Axis Stage Movement Stroke X/Y/Z/=-40/40/30mm Tilt: 0~60° Rotation=360° Option: Stage Motorization (3 Axis-X/Y/R) Vacuum system Full Automation (or Manual Mode) Rotary Pump & Turbo Pump Convection Gauge(Pirani + Penning Gauge) Anti-Vibration Air-Cylinder type anti-vibrator included in frame. Air or Any gas supply such as N2 line required at Lab site Control Rack PC Environmental Operation Operating system : Windows Serial communication: control data interface Display System 22” LCD monitor Port 3 Port (For EDX, WDX, Etc.). Port Sufficient for all detector & Up-gradation GUI& Tools BSE Mode Converter Switch(BSE, EDX, ETC.) Pixel averaging scan/ Photo Scan/ etc. Measurement (Angle, Area, Horizontal. Vertical, Width, Cross, Box) Simple Measuring function by using Horizontal Line, Vertical Line, Diagonal Lines, Boxes, Angle, Area, etc. Annotation (Symbol Such Circle, Boxes, Line, Arrowed, Line), Image Shift & Image Rotation(Raster Rotation) Image Compression / Compression Type : BMP, JPEG, Data Including Magnification, Working Distance, KV & Mark Bar. Thumbnail Image Display Image Processor Length/Min.dia/Max dia/Circularity/Eccentricity/Excel Data/Graph Data export to Excel file with original Image Free Line Measurement, Grain analysis Various User Define Filters Image Tiling AOI(Area Of Interest) Particle Counter (Blob Analysis) Automatic Control Auto Brightness/ Contrast Multi Focus & Dynamic Focus Auto Focus/ Auto stigmator/ etc. Auto Emission Beam Current Raster Rotation (Mouse Adjustment) Cathode Using Time ( Life Time)) Mouse Control(Dragging or Scroll Methodology)

Angstrom Advanced finished the optimization of ADX series X-ray Diffraction Instrument

Boston, Massachusetts, USA - July 4, 2016 – Angstrom Advanced Inc, Angstrom Advanced Inc release the optimized ADX series XRD equipment with more rapid, accurate and stable analysis capacity.

Distributed Energy Article about Angstrom Advanced

Feb 25th 2013 Boston, United States

The leading clean energy magazine "Distributed Energy" has recently published an article about the cutting-edge technology Angstrom Advanced has developed to specially serve the Distributed Renewable Energy market: "Hydrogen is a very valuable alternative to fossil fuel for distributed energy generation, delivering a high-powered solution with minimal environmental and safety concerns. Green businesses, telecomm providers, governments, and renewable energy advocates can now produce on-demand energy for their assets, at minimal cost and using commercially available equipment. This article will look at the benefits associated with hydrogen and fuel cell energy systems compared to fossil fuel and chemical alternatives as well as the inherent costs associated with a fuel cell on-demand generator. This analysis will show that it is not only technically feasible to use hydrogen for on-demand energy in certain, but also that it can be more economic than the alternatives. Diesel generators are valuable when used only for applications that have short run times (less than eight hours per day) and where they are in proximity to a low-cost fuel source. For longer run times, and when used in more remote and extreme conditions, renewable hydrogen generators are an ideal solution for providing on-demand energy...

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Angstrom Advanced Knowledge Base: Introduction of Atomic Force Microscope and Scanning Force Microscope

The AFM consists of a cantilever with a sharp tip (probe) at its end that is used to scan the specimen surface. The cantilever is a silicon or silicon nitride with a tip radius of curvature on the order of nanometers. When the tip is brought into proximity of a sample surface, forces between the tip and the sample lead to a deflection of the cantilever according to Hooke's law. Depending on the situation, forces that are measured in AFM include mechanical contact force, van der Waals forces, capillary forces, chemical bonding, electrostatic forces, magnetic forces, Casimir forces, solvation forces, etc. Along with force, additional quantities may simultaneously be measured through the use of specialized types of probe. Typically, the deflection is measured using a laser spot reflected from the top surface of the cantilever into an array of photodiodes. Other methods that are used include optical interferometry, capacitive sensing or piezoresistive AFM cantilevers. These cantilevers are fabricated with piezoresistive elements that act as a strain gauge. Using a Wheatstone bridge, strain in the AFM cantilever due to deflection can be measured, but this method is not as sensitive as laser deflection or interferometry.

Atomic force microscope topographical scan of a glass surface. The micro and nano-scale features of the glass can be observed, portraying the roughness of the material. The image space is (x,y,z) = (20um x 20um x 420nm). If the tip was scanned at a constant height, a risk would exist that the tip collides with the surface, causing damage. The feedback mechanism is employed to adjust the tip-to-sample distance to maintain a constant force between the tip and the sample. The sample is mounted on a piezoelectric tube, that can move the sample in the z direction for maintaining a constant force, and the x and y directions for scanning the sample. The tip is mounted on a piezo scanner while the sample is being scanned in X and Y using another piezo block. The resulting map of the area z = f(x,y) represents the topography of the sample.

The AFM can be operated in a number of modes, depending on the application. In general, possible imaging modes are divided into contact modes and a non-contact modes where the cantilever is vibrated.

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Angstrom Advanced Atomic Force Microscope and Scanning Force Microscope Software

The Software is available with the following data types of images: AFM Contact Mode: Topography — the rise and fall of the sample surface. Deflection — cantilever flexes because of the rise and fall of sample topography and the amount of this deflection can be reflected by the photodetector’s Up-Down signal. Friction — lateral forces between tip and sample, which causes the torsion of the cantilever and can be reflected by the photodetector’s Left-Right signal. AFM Tapping Mode: Topography — the rise and fall of the sample surface. Amplitude — cantilever oscillating amplitude changes because of the rise and fall of sample topography. Phase — cantilever oscillating phase changes because of the sample material characteristics. Scanning Tunneling Microscope: Topography —the rise and fall of the sample surface. Current — Tunneling current changes between tip and sample surface.

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Atomic Force Microscope Modes (Angstrom Advanced)

Angstrom Advanced STM relies on “tunneling current” between the probe and the sample to sense the topography of the sample. The STM probe, a sharp metal tip (in the best case, atomically sharp), is positioned a few atomic diameters above a conducting sample which is electrically biased with respect to the tip. At a distance under 1 nanometer, a tunneling current will flow from sample to tip. In operation, the bias voltages typically range from 10 to 1000 mV while the tunneling currents vary from 0.1 to10 nA. 
The tunneling current changes exponentially with the tip-sample separation, typically decreasing by a factor of two as the separation is increased 0.2 nm. The exponential relationship between the tip separation and the tunneling current makes the tunneling current an excellent parameter for sensing the tip-to-sample separation. In essence, a reproduction of the sample surface is produced by scanning the tip over the sample surface and sensing the tunneling current. 

STM relies on a precise scanning technique to produce very high-resolution, three-dimensional images of sample surfaces. The STM scans the sample surface beneath the tip in a raster pattern while sensing and outputting the tunneling current to the SPM Controller. The digital signal processor (DSP) in the Controller controls the Z position of the Piezo Scanner based on the tunneling current error signal. The STM operates in both “constant height” and “constant current” data modes, depending on the Feedback Gain settings. The DSP always adjusts the height of the tip based on the tunneling current error signal, but if the feedback gains are set extremely low (e.g., Integral Gain < 15 and Proportional Gain < 15), the piezo remains at a nearly constant height while tunneling current data is collected. With the Feedback Gains high (e.g., Integral Gain >15 and Proportional Gain >15), the Scanners Piezo height changes to keep the tunneling current nearly constant, and changes in piezo height are used to construct the image. The exponential relationship between tip-sample separation and tunneling current allows the tip height to be controlled very precisely. Angstrom Advanced AFM systems are available with multi-function setups to cover the broadest range of laboratory and academic applications.

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In Tapping Mode, a cantilever is oscillating in free air at its resonant frequency. A piezo stack excites the cantilever’s substrate vertically, causing the tip to bounce up and down. As the cantilever bounces vertically, the reflected laser beam is deflected in a regular pattern over a photodiode array, generating a sinusoidal electronic signal. And this signal is converted to a root mean square (RMS) amplitude value. 

When the same cantilever is oscillating at the sample surface, Although the piezo stack continues to excite the cantilever’s substrate with the same energy, the tip is deflected in its encounter with the surface. The reflected laser beam reveals information about the vertical height of the sample surface.

The feedback system controls the scanner’s Z voltage to maintain the tip-sample force constant, which leads the Up-Down signal equals to the Setpoint. The Z voltage is recorded for calculating the sample topography. Figure 1: No force between tip and sample, no cantilever deflection. Figure 2: Repulsion between tip and sample, cantilever deflects upside. Figure 3: Repulsion between tip and sample, cantilever deflects upside: X: Deflection of cantilever k: Force constant of cantilever F=kx

Angstrom Advanced Inc

Angstrom Advanced Inc. designs, manufactures and supplies variety of scientific instruments and Hydrogen & Nitrogen plants for academic and industrial fields. Angstrom Advanced instruments and plants have been delivered to many renowned organizations. Angstrom Advanced goal is to provide customers with the best products with highest standard of service at cost efficient pricing. Angstrom Advanced now provides several product lines including Spectrophotometer, X-ray Diffractometer, Gas Generator, Atomic Force Microscope/Scanning Probe Microscope, Hydrogen Generating Plant and Nitrogen Generating Plant. Angstrom Advanced corporate headquarters are located  in Massachusetts, USA. Angstrom Advanced have numerous partnerships, representatives in countries around the world.

Angstrom Advanced delivers a reputable and highly efficient world accepted Hydrogen and Nitrogen Generating Plants for refinery, petrochemical and other industrial applications. Angstrom Advanced services for Hydrogen Plant projects typically include conceptual design, detailed engineering, procurement, fabrication, construction, start-up and operational training. The production line of Gas Generators includes Hydrogen Plant, Nitrogen Plant and Air Plant. The combination Plants for both Hydrogen and Nitrogen, and Air and Hydrogen are available. These generators have state of the art technology, stability and functionality for scientific instruments, industry and solar and wind energy. Angstrom Advanced provide a lump-sum, turnkey solution, handling everything from concept to start-up with our own resources whenever possible. k

Angstrom Advanced Hydrogen Generating Plant product line include technologies such as:

• Hydrogen Plant by Water Electrolysis
• Hydrogen plant by Natural Gas Steam Reforming
• Hydrogen Plant by Pressure Swing Adsorption with Purifying System
• Hydrogen Plant by Ammonia Decomposition with Purifying System
• Hydrogen Plant by Methanol Decomposition

Angstrom Advanced offers gas and liquid Nitrogen Generating Plants from 0.5 m3/hr to 10000 m3/hr. Angstrom Advanced is on the forefront of technologies for Pressure Swing Adsorption (PSA) and Membrane Separation and providing turn-key nitrogen generation projects to meet different industrial applications. We also offer Nitrogen Purifying System to purify the nitrogen up to 99.9995%. Nitrogen/Oxygen Plant by Pressure Swing Adsorption (PSA).

Angstrom Advanced Nitrogen Generating Plant product line include technologies such as:

• Nitrogen Plant by Membrane Separation
• Nitrogen Purifying System
• Liquid Nitrogen, Oxygen, Argon Plant by Cryogenic Technology

Angstrom Advanced Atomic Force Microscope / Scanning Probe Microscope include AFM, SPM, STM, LFM, EFM. All of Angstrom Advanced microscope line-up bring state the art technology to meet the most advanced applications and are designed to provide images of atomic scale up to 100 micrometer. With a Digital Signal Processor inside the system, Angstrom Advanced systems can handle complicated multi-functional tasks efficiently. Angstrom Advanced Atomic Force Microscopes (AFM) which has full coverage of Contacting Mode, Tapping Mode, Phase Imaging and Lifting Mode, Lateral Force Microscope (LFM), Scanning Tunneling Microscope (STM), Conductive AFM, SPM in liquid, Environmental Control SPM, Nano-Processing System including Lithography Mode and Vector Scan Mode.

Angstrom Advanced has been bringing forth the latest advancements in all fields of technology and was founded by a group of engineers that realized the importance to research and development for the better of mankind. Angstrom Advanced location in the heart of high technology schools and Institutes made us a leading developer and manufacturer of Scientific instruments. Angstrom Advanced instruments have been delivered to many renowned universities, research institutes and companies worldwide. Angstrom Advanced goal is to supply the most accurate and sustainable scientific instrument with the highest standard of customer satisfaction.

Our goal is to provide our customers with the best products with highest standard of service at cost efficient pricing.

Learn more by visiting the Angstrom Advanced website at: www.angstrom-advanced.com

Angstrom Advanced Knowledge Base:Scanning Probe Microscope/ Atomic Force Microscope

The sample is placed on the Piezo Electric Scanner and is scanned under a stationary cantilever tip (there are AFM models in which the tip is scanned over a stationary sample). The PES is a very precise component and is able to accurately move the sample through a scan (a back and forth raster pattern) of only a few hundred nanometers. Scanners are made of piezo tubes and are steady held in the SPM base.Voltage applied to piezoelectric scanner tube housed inside moves sample precise increments back and forth. Size at bottom indicates maximum size scan possible,each scanner has its own specified parameters. 

Samples are held in place on the scanner with a removable cap. Piezo scanner can extend and retract 3-dimentionally based on the applied X, Y and Z voltage placed across the individual elements.

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